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Siami, Mohammad
ORCID: https://orcid.org/0000-0003-2067-374X; Dąbek, Przemysław
ORCID: https://orcid.org/0000-0002-4026-708X; Shiri, Hamid
ORCID: https://orcid.org/0000-0002-1878-4718; Barszcz, Tomasz
ORCID: https://orcid.org/0000-0002-1656-4930; Zimroz, Radosław
ORCID: https://orcid.org/0000-0003-4781-9972.
2026
A surface defect detection system for industrial conveyor belt inspection using Apple’s TrueDepth camera technology.
Applied Sciences, 16 (2).
609.
10.3390/app16020609
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