Low-altitude measurements of 2–6 MeV electron trapping lifetimes at 1.5 ≤ L ≤ 2.5

Baker, D.N.; Kanekal, S.G.; Horne, R.B. ORCID:; Meredith, N.P. ORCID:; Glauert, S.A. ORCID: 2007 Low-altitude measurements of 2–6 MeV electron trapping lifetimes at 1.5 ≤ L ≤ 2.5. Geophysical Research Letters, 34 (20), L20110. 5, pp.

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During the Halloween Storm period (October–November 2003), a new Van Allen belt electron population was powerfully accelerated. The inner belt of electrons formed in this process decayed over a period of days to years. We have examined quantitatively the decay rates for electrons seen in the region of 1.5 ≤ L ≤ 2.5 using SAMPEX satellite observations. At L = 1.5 the e-folding lifetime for 2–6 MeV electrons was τ ∼ 180 days. On the other hand, for the half-dozen distinct acceleration (or enhancement) events seen during late-2003 through 2005 at L ∼ 2.0, the lifetimes ranged from τ ∼ 8 days to τ ∼ 35 days. We compare these loss rates to those expected from prior studies. We find that lifetimes at L = 2.0 are much shorter than the average 100–200 days that present theoretical estimates would suggest for the overall L = 2 electron population. Additional wave-particle interaction aspects must be included in theoretical treatments and we describe such possibilities here.

Item Type: Publication - Article
Digital Object Identifier (DOI):
Programmes: BAS Programmes > Global Science in the Antarctic Context (2005-2009) > Sun Earth Connections
ISSN: 0094-8276
NORA Subject Terms: Physics
Space Sciences
Date made live: 05 Feb 2009 13:57 +0 (UTC)

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