Low-altitude measurements of 2–6 MeV electron trapping lifetimes at 1.5 ≤ L ≤ 2.5
Baker, D.N.; Kanekal, S.G.; Horne, R.B.; Meredith, N.P.; Glauert, S.A.. 2007 Low-altitude measurements of 2–6 MeV electron trapping lifetimes at 1.5 ≤ L ≤ 2.5. Geophysical Research Letters, 34 (20), L20110. 5, pp. 10.1029/2007GL031007Before downloading, please read NORA policies.
During the Halloween Storm period (October–November 2003), a new Van Allen belt electron population was powerfully accelerated. The inner belt of electrons formed in this process decayed over a period of days to years. We have examined quantitatively the decay rates for electrons seen in the region of 1.5 ≤ L ≤ 2.5 using SAMPEX satellite observations. At L = 1.5 the e-folding lifetime for 2–6 MeV electrons was τ ∼ 180 days. On the other hand, for the half-dozen distinct acceleration (or enhancement) events seen during late-2003 through 2005 at L ∼ 2.0, the lifetimes ranged from τ ∼ 8 days to τ ∼ 35 days. We compare these loss rates to those expected from prior studies. We find that lifetimes at L = 2.0 are much shorter than the average 100–200 days that present theoretical estimates would suggest for the overall L = 2 electron population. Additional wave-particle interaction aspects must be included in theoretical treatments and we describe such possibilities here.
|Item Type:||Publication - Article|
|Digital Object Identifier (DOI):||10.1029/2007GL031007|
|Programmes:||BAS Programmes > Global Science in the Antarctic Context (2005-2009) > Sun Earth Connections|
|NORA Subject Terms:||Physics
|Date made live:||05 Feb 2009 13:57|
Actions (login required)